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This presentation is designed for those interested in non-destructive quantitative elemental analysis of solids and liquids.
Applications include metal alloys, precious metals, recycling, lead in paint, consumer products, soils, plastics,
mineral exploration and
archeometry.
Hand held XRF technology has been available for elemental analysis since about 1990.
Over the years, advances in technology have lowered elemental-detection limits, and increased accuracy and speed.
The most recent advance has been the replacement of the standard silicon pin detector by the silicon-drift detector.
The silicon-drift detector allows the instruments to quantify the levels of the light elements such as Al, Mg, S & P, & Si
in various matrices without the need for inert atmosphere or vacuum.
In a matter of seconds, these instruments can perform near-laboratory-quality analysis in the field.
This will be a short interactive presentation and a chance for hands-on application.
Attendees are encouraged to bring in samples for testing.
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